Physical Chemistry of Surfaces, Interfaces and Thin Layers

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Part of: "Ilie Murgulescu" Institute of Physical Chemistry of the Romanian Academy

Location: Bucharest, Romania

Our research group combines at the highest scientific level the expertise of renowned scientists both in physics and in chemistry with top-equipped facilities in material science and physical chemistry domains.

Either you look for qualitatively and quantitatively determination of the chemical species in your samples, or the surface morphology up to atomic resolution combined with depth profiling, or perhaps you are interested in optical characterization on a broad spectral range of thin films prepared by various methods, or get a detailed glimpse on electrical properties in your samples, just to name a few, we provide them all.

We provide the only Spectroscopic Ellipsometer in the IR domain: IR-SE (2 - 33 μm). Using this system the following material properties could be investigated: material composition, chemical bonding – molecular vibrations, phonon absorption – crystalline materials, doping concentration, free carrier absorption, anisotropy – uniaxial and biaxial.

The proof of the quality of our services lies in the impressive number of scientific papers published in prestigious journals, in the multitude of national and international ongoing research grants, in the interacademic collaborations with external partners, in services offered to private companies and in organizing and promoting an annual international workshop dedicated to spectroscopic techniques.

Contact

Name: Physical Chemistry of Surfaces, Interfaces and Thin Layers

Contact information 

Phone: 0213167912

Address: Splaiul Independentei 202 Bucharest 060021
Bucuresti - Sector 6 Romania

Direct link to EERTIS page 
https://eertis.eu/erlb-2300-000z-7657

[T: 0.3092, O: 88]
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